X-ray diffractometer XSTRESS X3000 G2
A non-destructive measurement of residual stresses is possible using X-ray diffraction. This involves evaluating the reflection of X-rays on the atomic lattice planes of crystalline materials. The measurement is carried out according to the Bragg principle. This enables a comparison between the grid plane spacing d0 in the unloaded state and the grid plane spacing d in the loaded state. Based on the difference of the net plane distance, a calculation of the residual stress is possible. At the Institute of Forming Technology and Forming Machines, this method of residual stress measurement is applied with the help of the X-ray diffractometer XSTRESS X3000 G2 from Stresstech. Furthermore, a determination of retained austenite is possible with this device for ferritic microstructures.
Feasible experiments and experimental parameters:
- Residual stress measurement (surface and depth profile)
- Determination of the retained austenite content in ferritic structures
Technical data:
- X-ray tube operating values: 30 kV, 8 mA
- Tube output: 200 - 300 W
- Maximum component size: theoretically unlimited
- 4-point bending device for the determination of the radiographic elasticity constants
- Different materials can be analysed using chrome, copper and titanium tubes
- Automatic mapping measurements are possible via programming of the X-Y table
- Precise movement through computer-controlled DC servo motor drives
- XTRONIC measurement and evaluation software with a large material database
